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Drool, Britannia? Is the UK Failing the Cloud?
By Roger Strukhoff
Richard Davies wrote: The UK has a good crop of technology pioneers in cloud computing - for example ElasticHosts, FlexiScale, Flexiant, OnApp - and also some strong government initiatives such as G-Cloud. We will have to see whether this kind of technical leadership converts into swift mass-market adoption or not.
Jan. 8, 2012 11:38 AM EST
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From the Wires
Advantest Announces T5587 Test Solution for the Expanding Multichip Package Market
New Memory Tester Offers High Throughput for DDR-SDRAM, NOR and NAND Flash Memory Test Needs

By: PR Newswire
Jun. 30, 2005 04:00 PM

TOKYO, June 30 /PRNewswire-FirstCall/ -- Advantest Corporation , the world's largest supplier of semiconductor test equipment, today announced global availability of its new memory test system, the T5587. With a two-station configuration that enables a best-in-class maximum parallel-test capacity of 512 devices, the T5587 offers high throughput on discrete NAND and multichip package (MCP) memory devices -- in high demand thanks to the exploding consumer electronics market.

The growing availability and accessibility of wireless broadband services has generated widespread development of such wireless handheld communications devices as cellular telephones and personal digital assistants (PDAs). As the proliferation of consumer devices in all different shapes and sizes continues to escalate, customer demand for a wider range of functionality and applications in various form factors is mounting concurrently. These trends form the background to the increasing demand for application-specific MCP memory devices, which enable optimal combinations of SDRAM with every type of flash memory. However, the specific characteristics, operating speeds, and pin counts of MCPs vary widely -- making the test function a considerable challenge, and forcing manufacturers to incorporate multiple testers into their operations.

Advantest's new T5587 memory tester solves this problem, offering a comprehensive, high-throughput solution for DDR-SDRAM, NOR and NAND flash memory test needs. The T5587 offers a maximum test speed of 200 MHz (400 Mbps in DDR mode), which supports MCPs, enabling incorporation of newer, faster types of flash memory such as DDR-SDRAM and NOR. When combined with Advantest's newest dynamic test handler, the M6300, the T5587's 512-device parallel test capacity will contribute to significant reductions in test cost on mass production lines.

About Advantest

Advantest Corporation is the world's largest supplier of automatic test equipment to the semiconductor industry. Advantest's SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984. More information is available at http://www.advantest.com/

For further information, contact Amy Gold Advantest America, Inc. 212 850 6670 email: a.gold@advantest.com Ellen Van Etten MCA 650 968 8900 evanetten@mcapr.com

Advantest Corporation

CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670 or
a.gold@advantest.com; or Ellen Van Etten of MCA, +1-650-968-8900 or
evanetten@mcapr.com, for Advantest

Web site: http://www.advantest.com/

Published Jun. 30, 2005
Copyright © 2005 SYS-CON Media, Inc. — All Rights Reserved.
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Copyright © 2007 PR Newswire. All rights reserved. Republication or redistribution of PRNewswire content is expressly prohibited without the prior written consent of PRNewswire. PRNewswire shall not be liable for any errors or delays in the content, or for any actions taken in reliance thereon.

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