| By Business Wire | Article Rating: |
|
| February 15, 2013 10:33 AM EST | Reads: |
161 |
Research and Markets (http://www.researchandmarkets.com/research/5m6rxq/avago_fbar_filter) has announced the addition of the "Avago FBAR Filter All-Silicon MEMS Duplexer Reverse Costing Analysis" report to their offering.
The highest volume production MEMS using TSV Technology based on AlN piezoelectric active layer
With more than 1 Billion units produced per year and a market share of 65%, Avago Technologies clearly dominates the BAW filter market. The ACMD-7612 is an UMTS Duplexer manufactured with Avago's film bulk acoustic resonator (FBAR) technology which uses AlN piezoelectric material for resonating layers.
The filters are hermetically wafer-level packaged with Avago's Microcap bonded-wafer CSP technology, allowing the filters to be assembled in a molded chip-on-board module of less than 1.2 mm high.
TSVs are etched in the cap in order to report electrical contacts and thus reduce filter dies size.
The ACMD-7612 is targeted for handsets or data terminals operating in the UMTS Band I frequency range and features a Maximum RF Input Power to Tx Port of ±33 dBm.
This report provides complete tear-down of the FBAR duplexer with:
- Detailed photos
- Material analysis
- Schematic assembly description
- Manufacturing Process Flow (including AlN process, wafer capping and TSV manufacturing)
- In-depth manufacturing cost analysis
- Supply chain evaluation
- Selling price estimation
Key Topics Covered:
Glossary
Overview/Introduction
Company Profile
Physical Analysis
- Physical Analysis Methodology
- Package Characteristics & Markings
- Package X-Ray
- Package Opening - Main Parts
- Package Cross-Section
- MEMS Dies Dimensions
- MEMS Dies Markings
- MEMS Dies Bond Pads & TSV
- Tx Die Opening
- Tx Die Cap
- Tx Die FBAR
- Rx Die Opening
- MEMS Die Cross-section - Overview
- MEMS Die Cross-section - TSV
- MEMS Die Cross-section - Membrane
- MEMS Die Cross-section - Contacts
Manufacturing Process Flow
- Global Overview
- MEMS Process Overview
- FBAR Process Flow
- Cap Process Flow
- Wafer Bonding Process Flow
- Description of the Wafer Fabrication Unit
- Component Packaging Process Flow
Cost Analysis
- Synthesis of the Cost Analysis
- Main Steps of Economic Analysis
- Yields Explanation
- Yields Hypotheses
- Dies per wafer & Probe Test
- MEMS Front-End Cost
- MEMS Front-End cost per Process Steps
- Back-End 0: Probe Test & Dicing Cost
- MEMS Dies Cost
- Back-End: Packaging Cost
- Back-End: Packaging Cost per steps
- Back-End: Final test Cost
- ACMD-7612 Component Cost (FE + BE 0 + BE 1)
Estimated Price Analysis
For more information visit http://www.researchandmarkets.com/research/5m6rxq/avago_fbar_filter.
Published February 15, 2013 Reads 161
Copyright © 2013 SYS-CON Media, Inc. — All Rights Reserved.
Syndicated stories and blog feeds, all rights reserved by the author.
More Stories By Business Wire
Copyright © 2009 Business Wire. All rights reserved. Republication or redistribution of Business Wire content is expressly prohibited without the prior written consent of Business Wire. Business Wire shall not be liable for any errors or delays in the content, or for any actions taken in reliance thereon.

